High Temperature Reverse Bias(HTRB)

JESD22-A108, JESD85,

MIL-STD-750-1 M1038 Method A

1000hrs 80% rated @Tj=175°C

1000hrs 100% rated @Tj=175°C

High Temperature Gate Bias(HTGB)

JESD22-A108, JESD85

1000hrs 80% rated @Tj=175°C

1000hrs 100% rated @Tj=175°C

Preconditioning (PC)

J-STD-020, JESD22A-113

Performed prior to H3TRB, IOL, HAST, TC   and AC

Temperature Cycling (TC)

JESD22-A104

1000cyc @-55°C/+150°C

1000cyc / 2000cyc @-55°C/+150 °C

Intermittent Operating Life(IOL)

JESD22-A122,

MIL-STD-750 Method 1037

15Kcyc @Tjswing=100°C

7.5K / 15Kcyc extended @Tjswing=125°C

Highly Accelerated Stress Testing   (HAST)

JESD22-A110

96hrs @85%RH, 130°C, 33.5psia, 42V

96hrs / 192hrs extended @85%RH, 130°C,   33.5psia, 42V

High Humidity High Temperature Reverse   Bias (H3TRB)

JESD22-A101

1000hrs @85%RH, 85°C,100V

1000hrs / 2000hrs extended @85%RH,   85°C,100V

Autoclave(AC)

JESD22-A102

Not required

96hrs @100%RH, 121°C

Human Body Model (HBM)

ANSI/ESDA/JEDEC JS-001-2012,

AEC-Q101-001

Classification

Classification

Charged Device Model (CDM)

JESD22-C101,

AEC-Q101-005

Classification

Classification

Electrical parameter assessment /   Parametric Verification

JESD86

Ta per datasheet

Ta per datasheet